Xafs and Xps Analysis of Zn0.98Fe0.02Te0.91Se0.09 Semiconductor

AuthID
P-00A-599
8
Author(s)
Radisavljevic, I
·
Trigueiro, J
·
Medic, M
·
Romcevic, N
·
Mitric, M
·
Ivanovic, N
Tipo de Documento
Article
Year published
2015
Publicado
in JOURNAL OF ALLOYS AND COMPOUNDS, ISSN: 0925-8388
Volume: 632, Páginas: 17-22 (6)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84922375565
Wos: WOS:000350388900003
Source Identifiers
ISSN: 0925-8388
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