Tem and Hrtem Characterization of Tial Diffusion Bonds Using Ni/Al Nanolayers

AuthID
P-00A-ANH
Tipo de Documento
Article
Year published
2015
Publicado
in MICROSCOPY AND MICROANALYSIS, ISSN: 1431-9276
Volume: 21, Número: 1, Páginas: 132-139 (8)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84925248499
Wos: WOS:000351763500013
Source Identifiers
ISSN: 1431-9276
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