Structural and Optical Characterization of Nb-Doped Pzt 65/35 Thin Films Grown by Sol-Gel and Laser Ablation Techniques

AuthID
 P-001-1SR
4
Author(s)
Ferreira, MIC
Tipo de Documento
Article
Year published
2000
Publicado
in JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, ISSN: 1454-4164
Volume: 2, Número: 5, Páginas: 602-609 (8)
Conference
Romanian Conference on Advanced Materials (Rocam 2000), Date: OCT 23-25, 2000, Location: BUCHAREST, ROMANIA, Patrocinadores: Romanian Acad
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Wos®
Publication Identifiers
Wos: WOS:000165225700025
Source Identifiers
ISSN: 1454-4164
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