Sampling Techniques of Non-Equally Probable Faults in Vlsi Systems

AuthID
 P-001-9WW
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
1998
Publicado
in 16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS in IEEE VLSI TEST SYMPOSIUM, ISSN: 1093-0167
Páginas: 283-288 (6)
Conference
16Th Ieee Vlsi Symposium, Date: APR 26-30, 1998, Location: MONTEREY, CA, Patrocinadores: IEEE Comp Soc, Test Technol Tech Comm, IEEE Philadelphia Sect
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0032319386
Wos: WOS:000074079600041
Source Identifiers
ISSN: 1093-0167
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