Robust Search Algorithms for Test Pattern Generation

AuthID
 P-001-D0W
2
Author(s)
Sakallah, KA
Tipo de Documento
Proceedings Paper
Year published
1997
Publicado
in TWENTY-SEVENTH ANNUAL INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, DIGEST OF PAPERS in INTERNATIONAL SYMPOSIUM ON FAULT-TOLERANT COMPUTING, ISSN: 0731-3071
Páginas: 152-161 (10)
Conference
27Th Annual International Symposium on Fault-Tolerant Computing (Ftcs-27), Date: JUN 24-27, 1997, Location: SEATTLE, WA, Patrocinadores: IEEE Comp Soc, Tech Comm Fault Tolerant Comp, IFIP WG 10.4 Dependable Comp & Fault Tolerance
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Dblp®/pt/publications/view/46108
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Publication Identifiers
DBLP: conf/ftcs/SilvaS97
Wos: WOS:A1997BJ24K00018
Source Identifiers
ISSN: 0731-3071
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