Cathodoluminescence Study of Gan Epitaxial Layers

AuthID
 P-001-D7N
8
Author(s)
Cremades, A
·
Piqueras, J
·
Xavier, C
·
Meyer, BK
·
Hofmann, DM
·
Fischer, S
Tipo de Documento
Article
Year published
1996
Publicado
in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107
Volume: 42, Número: 1-3, Páginas: 230-234 (5)
Conference
4Th International Workshop on Beam Injection Assessment of Defects in Semiconductors (Biads 96), Date: JUN 03-06, 1996, Location: EL ESCORIAL, SPAIN
Indexing
Wos®
Scopus®
Crossref®24
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0001687018
Wos: WOS:A1996VZ84800040
Source Identifiers
ISSN: 0921-5107
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