Vhdl Fault Simulation for Defect-Oriented Test and Diagnosis of Digital Ics

AuthID
P-001-F4Q
5
Author(s)
Celeiro, F
·
Dias, L
·
Ferreira, J
·
Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in EURO-DAC '96 - EUROPEAN DESIGN AUTOMATION CONFERENCE WITH EURO-VHDL '96 AND EXHIBITION, PROCEEDINGS
Páginas: 450-455 (6)
Conference
European Design Automation Conference (Euro-Dac 96), with Euro-Vhdl 96 and Exhibition, Date: SEP 16-20, 1996, Location: GENEVA, SWITZERLAND, Patrocinadores: Gesell Informat e V, IEEE, Comp Soc, Tech Comm Design Automat, IEEE, Circuits & Syst Soc, Assoc Comp Machinery, Special Interest Grp Design Automat, IFIP 10.5, EDAC, CEPIS, European C A D Standardizat Initiat, Osterreich Comp Gesell, Schweizer Informat Gesell
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0029767124
Wos: WOS:A1996BG47Z00068
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