Defect-Oriented Ic Test and Diagnosis Using Vhdl Fault Simulation

AuthID
 P-001-FAM
5
Author(s)
Celeiro, F
·
Dias, L
·
Ferreira, J
·
Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, ISSN: 1089-3539
Páginas: 620-628 (9)
Conference
1996 International Test Conference (Itc 1996) - Test and Design Validity, Date: OCT 20-25, 1996, Location: WASHINGTON, DC, Patrocinadores: IEEE Comp Soc Test Technol Tech Comm, IEEE Philadelphia Sect
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0030407215
Wos: WOS:A1996BG68G00074
Source Identifiers
ISSN: 1089-3539
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