Breakdown Voltage Improvement of Standard Mos Technologies Targeted at Smart Power

AuthID
P-001-HQD
5
Author(s)
Simas, MIC
·
Lanca, M
·
Finco, S
·
Behrens, FH
1
Editor(es)
Anon
Tipo de Documento
Proceedings Paper
Year published
1995
Publicado
in IAS '95 - CONFERENCE RECORD OF THE 1995 IEEE INDUSTRY APPLICATIONS CONFERENCE/THIRTIETH IAS ANNUAL MEETING, VOLS 1-3 in IEEE Industry Applications Society Annual Meeting, ISSN: 0197-2618
Volume: 2, Páginas: 937-945 (9)
Conference
1995 Ieee Industry Applications Conference/30Th Ias Annual Meeting, Date: OCT 08-12, 1995, Location: LAKE BUENA VISTA, FL, Patrocinadores: IEEE, Ind Applicat Soc
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0029477056
Wos: WOS:A1995BE55K00124
Source Identifiers
ISSN: 0197-2618
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