Publicações

Special Issues and Methods for Testing Lnas at High Frequencies

AuthID
P-00F-J2C

Author(s)

Carnlo, JP

Mendes, PM

Couto, C

Correia, JH

Tipo de Documento

Proceedings Paper

Year published

2009

Publicado

in Proceedings of the DTIS'09 - 2009 4th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era

Páginas: 277-280

Conference

2009 4Th Ieee International Conference on Design and Technology of Integrated Systems in Nanoscale Era, Dtis'09, Date: 6 April 2009 through 7 April 2009, Location: Cairo, Patrocinadores: IEEE Circuits and Systems Society;IEEE Egypt Section

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