Rutherford Backscattering Spectrometry Characterization of Nanoporous Chalcogenide Thin Films Grown at Oblique Angles

AuthID
 P-00F-KEE
5
Author(s)
Martin Palma, RJ
·
Gago, R
·
Ryan, JV
·
Pantano, CG
Tipo de Documento
Article
Year published
2008
Publicado
in JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, ISSN: 0267-9477
Volume: 23, Número: 7, Páginas: 981-984 (4)
Indexing
Wos®
Google Scholar®
Publication Identifiers
Wos: WOS:000257146000008
Source Identifiers
ISSN: 0267-9477
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service