Aluminum Incorporation in Ti1-Xalxn Films Studied by X-Ray Absorption Near-Edge Structure

AuthID
 P-00F-KFY
5
Author(s)
Gago, R
·
Endrino, JL
·
Jimenez, I
·
Shevchenko, N
Tipo de Documento
Article
Year published
2009
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 105, Número: 11, Páginas: 113521 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-67649556971
Wos: WOS:000267053200054
Source Identifiers
ISSN: 0021-8979
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