Identification of Vh in Silicon by Epr

AuthID
P-00F-NQQ
5
Author(s)
Johannesen, P
·
Bech Nielsen, B
·
Bonde Nielsen, K
Tipo de Documento
Article
Year published
1997
Publicado
in Materials Science Forum, ISSN: 0255-5476
Volume: 258-263, Número: PART 1, Páginas: 515-520
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0031339951
Source Identifiers
ISSN: 0255-5476
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