Photothermal and Photoconductive Determination of Surface and Bulk Defect Densities in Amorphous Silicon Films

AuthID
P-00F-R9R
8
Author(s)
Smith, ZE
·
Shepard, K
·
Aljishi, S
·
Kolodzey, J
·
Wagner, S
·
Chu, TL
Tipo de Documento
Article
Year published
1987
Publicado
in Applied Physics Letters, ISSN: 0003-6951
Volume: 50, Número: 21, Páginas: 1521-1523
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-21544433868
Source Identifiers
ISSN: 0003-6951
Export Publication Metadata
Info
At this moment we don't have any links to full text documens.