Surface Analysis of the Nanostructured W-Ti Thin Film Deposited on Silicon

AuthID
 P-00F-SXK
8
Author(s)
Petrovic, S
·
Radovic, M
·
Kovac, J
·
Mitric, M
·
Gakovic, B
·
Rakocevic, Z
Tipo de Documento
Article
Year published
2007
Publicado
in Applied Surface Science, ISSN: 0169-4332
Volume: 253, Número: 12, Páginas: 5196-5202
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-33847756724
Source Identifiers
ISSN: 0169-4332
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