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Minimally Unsatisfiable Boolean Circuits
AuthID
P-00F-X12
P-00F-X12
2
Author(s)
Belov, A
·
2
Editor(es)
Sakallah,KA;Simon,L
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in Theory and Applications of Satisfiability Testing - SAT 2011 - 14th International Conference, SAT 2011, Ann Arbor, MI, USA, June 19-22, 2011. Proceedings in Lecture Notes in Computer Science, ISSN: 0302-9743
Volume: 6695, Páginas: 145-158
Conference
14Th International Conference on Theory and Applications of Satisfiability Testing, Sat 2011, Date: 19 June 2011 through 22 June 2011, Location: Ann Arbor, MI, Patrocinadores: Microsoft Research;Microsoft Research INRIA Joint Centre;University of Michigan;University of Orsay Paris-Sud 11
Publication Identifiers
DBLP: conf/sat/BelovS11
SCOPUS: 2-s2.0-79959464179
Unpaywall: 10.1007/978-3-642-21581-0_13
Source Identifiers
ISSN: 0302-9743
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