Dft plus U Study of Electrical Levels and Migration Barriers of Early 3D and 4D Transition Metals in Silicon

AuthID
 P-00G-J8X
3
Author(s)
Santos, P
·
Tipo de Documento
Article
Year published
2015
Publicado
in PHYSICAL REVIEW B, ISSN: 1098-0121
Volume: 92, Número: 7
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Wos®
Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-84940099971
Wos: WOS:000359675600001
Source Identifiers
ISSN: 1098-0121
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