Response Time Analysis of Slotted Widom in Noisy Wireless Channels

AuthID
 P-00G-SXZ
4
Author(s)
Vahabi, M
·
Tennina, S
·
Andersson, B
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in PROCEEDINGS OF 2015 IEEE 20TH CONFERENCE ON EMERGING TECHNOLOGIES & FACTORY AUTOMATION (ETFA) in IEEE International Conference on Emerging Technologies and Factory Automation-ETFA, ISSN: 1946-0740
Volume: 2015-October, Páginas: 1-9 (9)
Conference
20Th Ieee Conference on Emerging Technologies and Factory Automation (Etfa), Date: SEP 08-11, 2015, Location: Univ Luxembourg, Interdisciplinary Ctr Secur Reliabil & Trust, LUXEMBOURG, Patrocinadores: IEEE, IEEE Ind Elect Soc, Host: Univ Luxembourg, Interdisciplinary Ctr Secur Reliabil & Trust
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Publication Identifiers
DBLP: conf/etfa/VahabiTTA15
SCOPUS: 2-s2.0-84952942722
Wos: WOS:000378564800069
Source Identifiers
ISSN: 1946-0740
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