Damage Formation and Annealing at Low Temperatures in Ion Implanted Zno

AuthID
P-000-0H8
6
Author(s)
Bilani, O
·
Wesch, W
·
Hayes, M
Tipo de Documento
Article
Year published
2005
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 87, Número: 19, Páginas: 1-3 (3)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-27644585502
Wos: WOS:000233058800017
Source Identifiers
ISSN: 0003-6951
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