Self-Consistent Depth Profiling and Imaging of Gan-Based Transistors Using Ion Microbeams

AuthID
 P-00H-CK0
4
Author(s)
Vázquez, L
·
Alves, L
Tipo de Documento
Article
Year published
2015
Publicado
in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, ISSN: 0168-583X
Volume: 348, Páginas: 246-250
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Source Identifiers
ISSN: 0168-583X
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service