Muon Diffusion and Trapping in Chalcopyrite Semiconductors

AuthID
P-00H-G5F
8
Author(s)
Vilão, R
·
Gil, J
·
Alberto, H
·
Campos, Nd
·
Weidinger, A
·
Yakushev, M
·
Cox, S
Tipo de Documento
Article
Year published
2003
Publicado
in Physica B: Condensed Matter, ISSN: 0921-4526
Volume: 326, Número: 1-4, Páginas: 181-184
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Publication Identifiers
Source Identifiers
ISSN: 0921-4526
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