X-Ray Characterization and Domain Structure of High-Quality Srbi 2 Ta 2 O 9 Single-Crystals Grown by Self-Flux Solution Method

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 P-00H-NHC
5
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Article
Year published
2004
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in Integrated Ferroelectrics, ISSN: 1058-4587
Volume: 68, Número: 1, Páginas: 259-268
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ISSN: 1058-4587
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