Process Fault Diagnosis Approach Based on Neural Observers

AuthID
 P-000-5NK
3
Author(s)
2
Editor(es)
LoBello,L;Sauter,T
Tipo de Documento
Proceedings Paper
Year published
2005
Publicado
in ETFA 2005: 10th IEEE International Conference on Emerging Technologies and Factory Automation, Vol 1, Pts 1 and 2, Proceedings in ETFA
Volume: 1 2 VOLS, Páginas: 1057-1060 (4)
Conference
10Th Ieee International Conference on Emerging Technologies and Factory Automation, Date: SEP 19-22, 2005, Location: Catania, ITALY, Patrocinadores: Univ Studi Catania, IEEE Ind Elect Soc, Iconics, Schneider, ST Microelect, Medianet Comunicaz SrL
Indexing
Wos®
Scopus®
Dblp®/pt/publications/view/5811
Publication Identifiers
DBLP: conf/etfa/PalmaCS05
SCOPUS: 2-s2.0-33847313767
Wos: WOS:000238575500148
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