Implanted Impurities in Wide Band Gap Semiconductors

AuthID
 P-00J-5P8
3
Author(s)
Vianden, R
Tipo de Documento
Article
Year published
2011
Publicado
in Defect and Diffusion Forum - DDF, ISSN: 1662-9507
Volume: 311, Páginas: 167-179
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ISSN: 1662-9507
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