Evaluation of Idd/Vout Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

AuthID
 P-00J-XMX
2
Author(s)
Tipo de Documento
Proceedings Paper
Year published
1996
Publicado
in Proceedings of the 1996 European Conference on Design and Test, EDTC 1996
Páginas: 264-268
Conference
1996 European Conference on Design and Test, Edtc 1996, Date: 11 March 1996 through 14 March 1996, Patrocinadores: ACM Special Interest Group on Design Automation (SIGDA)
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Publication Identifiers
SCOPUS: 2-s2.0-85030104109
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