Error Prediction and Detection Methodologies for Reliable Circuit Operation Under Nbti

AuthID
 P-00K-457
3
Author(s)
Vazquez Hernandez, J
·
Champac, V
·
Tipo de Documento
Proceedings Paper
Year published
2014
Publicado
in Proceedings - International Test Conference, ISSN: 1089-3539
Volume: 2015-February
Conference
45Th Ieee International Test Conference, Itc 2014, Date: 21 October 2014 through 23 October 2014, Patrocinadores: IEEE Computer Society Test Technology Technical Council;IEEE Philadelphia Section
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Publication Identifiers
SCOPUS: 2-s2.0-84954288366
Source Identifiers
ISSN: 1089-3539
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