Quantitative X-Ray Diffraction Analysis of Bimodal Damage Distributions in Tm Implanted Al0.15Ga0.85N

AuthID
 P-00K-AZA
5
Author(s)
Fialho, M
·
Tipo de Documento
Article
Year published
2016
Publicado
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 49, Número: 13
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Publication Identifiers
Wos: WOS:000371908800022
Source Identifiers
ISSN: 0022-3727
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