Density Functional Modeling of Defects and Impurities in Silicon Materials

AuthID
P-00K-ENQ
1
Author(s)
1
Editor(es)
Yoshida Y.Langouche G.
Tipo de Documento
Proceedings Paper
Year published
2015
Publicado
in Lecture Notes in Physics, ISSN: 0075-8450
Volume: 916, Páginas: 69-127
Conference
7Th Forum on Science and Technology of Silicon Materials, Silicon Forum 2014, Date: 19 October 2014 through 22 October 2014
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84964452785
Source Identifiers
ISSN: 0075-8450
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