Fault Diagnosis in Highly Dependable Medical Wearable Systems

AuthID
 P-00K-P1N
2
Author(s)
Tipo de Documento
Article
Year published
2016
Publicado
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 32, Número: 4, Páginas: 467-479 (13)
Conference
20Th Ieee International Mixed-Signal Testing Workshop (Imstw), Date: JUN 24-26, 2015, Location: Paris, FRANCE, Patrocinadores: IEEE, IEEE Comp Soc, TTTC, CNRS, Grenoble INP, Univ Joseph Fourier
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Publication Identifiers
SCOPUS: 2-s2.0-84979230953
Wos: WOS:000381976800008
Source Identifiers
ISSN: 0923-8174
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