An in Situ Atomic Force Microscope for Normal-Incidence Nanofocus X-Ray Experiments

AuthID
P-00K-V7T
11
Author(s)
Fuchs, Y
·
Dane, T
·
Rosenthal, M
·
Panzarella, A
·
Hignette, O
·
Dupuy, L
·
Burghammer, M
·
Tipo de Documento
Article
Year published
2016
Publicado
in JOURNAL OF SYNCHROTRON RADIATION, ISSN: 1600-5775
Volume: 23, Número: 5, Páginas: 1110-1117 (8)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84984865418
Wos: WOS:000382299500009
Source Identifiers
ISSN: 1600-5775
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