Quantitative X-Ray Diffraction Analysis of Bimodal Damage Distributions in Tm Implanted Al 0.15 Ga 0.85 N

AuthID
 P-00M-09J
5
Author(s)
Magalhães, S
·
Fialho, M
·
Peres, M
·
Tipo de Documento
Article
Year published
2016
Publicado
in Journal of Physics D: Applied Physics - J. Phys. D: Appl. Phys., ISSN: 0022-3727
Volume: 49, Número: 13, Páginas: 135308
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ISSN: 0022-3727
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