Simultaneous Probing of Phase Transformations in Ni-Ti Thin Film Shape Memory Alloy by Synchrotron Radiation-Based X-Ray Diffraction and Electrical Resistivity

AuthID
 P-002-0Q4
6
Author(s)
Baehtz, C
·
von Borany, J
Tipo de Documento
Article
Year published
2013
Publicado
in MATERIALS CHARACTERIZATION, ISSN: 1044-5803
Volume: 76, Páginas: 35-38 (4)
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Publication Identifiers
SCOPUS: 2-s2.0-84872134234
Wos: WOS:000315366200005
Source Identifiers
ISSN: 1044-5803
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