Relationship Between Nano-Architectured Ti1-X Cu (X) Thin Film and Electrical Resistivity for Resistance Temperature Detectors

AuthID
 P-00M-NBJ
6
Author(s)
Ferreira, A
·
Lopes, C
·
Rodrigues, MS
·
Tipo de Documento
Article
Year published
2017
Publicado
in JOURNAL OF MATERIALS SCIENCE, ISSN: 0022-2461
Volume: 52, Número: 9, Páginas: 4878-4885 (8)
Indexing
Wos®
Scopus®
Crossref®16
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85007448711
Wos: WOS:000395105500009
Source Identifiers
ISSN: 0022-2461
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