Pattern-Based Usability Testing

AuthID
 P-00M-PQA
2
Author(s)
Dias, F
·
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017 in ICST Workshops
Páginas: 366-371
Conference
10Th Ieee International Conference on Software Testing, Verification and Validation Workshops, Icstw 2017, Date: 13 March 2017 through 17 March 2017, Patrocinadores: Aster;et al.;IEEE;IEEE Computer Society;Japan Software Testing Qualifications Board (JSTQB);Waseda University
Indexing
Scopus®
Dblp®/pt/publications/view/678634
Crossref®8
Google Scholar®
Publication Identifiers
DBLP: conf/icst/DiasP17
SCOPUS: 2-s2.0-85018423852
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