Inspection of Cracks in Aluminum Multilayer Structures Using Planar Ect Probe and Inversion Problem

AuthID
 P-00M-QN5
4
Author(s)
Pasadas, DJ
·
Rocha, TJ
Tipo de Documento
Article
Year published
2017
Publicado
in IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, ISSN: 0018-9456
Volume: 66, Número: 5, Páginas: 920-927 (8)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 23-26, 2016, Location: Taipei, TAIWAN, Patrocinadores: IEEE, IEEE Instrumentat & Measurement Soc, NAR Labs, Instrument Technol Res Ctr, TRIOPTICS Taiwan, HsintekOptics, BASO Precis Opt Ltd, Ind Technol Res Inst, YINSH, T & U, Lumos Technol Co Ltd, Zimmerman Sci Co Ltd, CMOS Sensor Inc, arn, Keysight Technologies, Zurich Instruments, Samwell Testing Inc
Indexing
Wos®
Scopus®
Crossref®25
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85018593865
Wos: WOS:000399246000008
Source Identifiers
ISSN: 0018-9456
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service