Satisfiability-Based Functional Delay Fault Testing

AuthID
 P-00M-WDA
3
Author(s)
Kim, Joonyoung
·
Sakallah, KaremA.
3
Editor(es)
L. Miguel Silveira; Srinivas Devadas; Ricardo Augusto da Luz Reis
Tipo de Documento
Proceedings Paper
Year published
1999
Publicado
in VLSI: Systems on a Chip, IFIP TC10/WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI '99), December 1-4, 1999, Lisbon, Portugal in IFIP Conference Proceedings
Volume: 162, Páginas: 362-372
Indexing
Dblp®/pt/publications/view/684458
Publication Identifiers
DBLP: conf/ifip10-5/KimSS99
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