Efficient and Robust Test Generation-Based Timing Analysis

AuthID
 P-00M-WDK
2
Author(s)
Sakallah, KaremA.
Tipo de Documento
Proceedings Paper
Year published
1994
Publicado
in 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30 - June 2, 1994
Páginas: 303-306
Indexing
Dblp®/pt/publications/view/684467
Publication Identifiers
DBLP: conf/iscas/SilvaS94
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