Off-Axis Electron Holography of Unbiased and Reverse-Biased Focused Ion Beam Milled Si P-N Junctions

AuthID
 P-00N-H50
5
Author(s)
Broom, RF
·
Midgley, PA
Tipo de Documento
Article
Year published
2005
Publicado
in Microscopy and Microanalysis, ISSN: 1431-9276
Volume: 11, Número: 01, Páginas: 66-78
Indexing
Crossref®
Google Scholar®
Publication Identifiers
Source Identifiers
ISSN: 1431-9276
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service