Experimental Characterization of Megavoltage Beams for Orthogonal Ray Imaging

AuthID
 P-00N-M72
7
Author(s)
Travassos, C
·
Barros, MA
·
Lencart, J
·
Tipo de Documento
Proceedings Paper
Year published
2017
Publicado
in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
Volume: 2017-January
Conference
2016 Ieee Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, Nss/Mic/Rtsd 2016, Date: 29 October 2016 through 6 November 2016
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Publication Identifiers
SCOPUS: 2-s2.0-85041508947
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