Publicações

AuthID
P-00N-S1S

Author(s)

Vaqueiro Contreras, M

Markevich, VP

Mullins, J

Halsall, MP

Murin, LI

Falster, R

Binns, J

Peaker, AR

Tipo de Documento

Article

Year published

2018

Publicado

in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979

Volume: 123, Número: 16

Conference

29Th International Conference on Defects in Semiconductors (Icds), Date: JUL 31-AUG 04, 2017, Location: Matsue, JAPAN

Indexing

Wos^®

Scopus^®

Crossref^®4

Google Scholar^®

Publication Identifiers

DOI: 10.1063/1.5011351

SCOPUS: 2-s2.0-85043994004

Wos: WOS:000431147200018

Source Identifiers

ISSN: 0021-8979

Export Publication Metadata

Lista Marked

Info

At this moment we don't have any links to full text documens.

Links Úteis