Contact Pressure and Flexibility of Multipin Dry Eeg Electrodes

AuthID
 P-00N-WKB
8
Author(s)
Fiedler, P
·
Griebel, S
·
Zanow, F
·
Haueisen, J
Tipo de Documento
Article
Year published
2018
Publicado
in IEEE TRANSACTIONS ON NEURAL SYSTEMS AND REHABILITATION ENGINEERING, ISSN: 1534-4320
Volume: 26, Número: 4, Páginas: 750-757 (8)
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Scopus®
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Publication Identifiers
Pubmed: 29641379
SCOPUS: 2-s2.0-85043388417
Wos: WOS:000429692400004
Source Identifiers
ISSN: 1534-4320
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