Time-Of-Flight Secondary Ion Mass Spectrometry Study on Be/Al-Based Multilayer Interferential Structures

AuthID
 P-00P-18R
11
Author(s)
Drozdov, MN
·
Drozdov, YN
·
Chkhalo, NI
·
Polkovnikov, VN
·
Yunin, PA
·
Chirkin, MV
·
Gololobov, GP
·
Suvorov, DV
·
Fu, DJ
·
Pelenovich, V
·
Tipo de Documento
Article
Year published
2018
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 661, Páginas: 65-70 (6)
Indexing
Wos®
Scopus®
Crossref®4
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85050115882
Wos: WOS:000440074500010
Source Identifiers
ISSN: 0040-6090
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