Interstitial Carbon-Related Defects in Si1-Xgex Alloys

AuthID
P-00P-3Y1
10
Author(s)
Khirunenko, LI
·
Pomozov, YV
·
Sosnin, MG
·
Duvanskii, A
·
Torres, VJB
·
Abrosimov, NV
·
Riemann, H
4
Editor(es)
Cavallini, A; Richter, H; Kittler, M; Pizzini, S
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY XII in Solid State Phenomena, ISSN: 1012-0394
Volume: 131-133, Páginas: 59-+ (3)
Conference
12Th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology, Date: OCT 14-19, 2007, Location: Erice, ITALY, Patrocinadores: Solar World AG Deutsch Cell GMbH, Deutsch Solar AG, European MRS, MEMC Elect Mat, Trans Tech Publicat
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Publication Identifiers
Wos: WOS:000252201200010
Source Identifiers
ISSN: 1012-0394
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