Analysis of the Conditions for Worst Case Switching Activity in Integrated Circuits

AuthID
P-00P-54N
3
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2010
Publicado
in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS) in IEEE Latin American Symposium on Circuits and Systems, ISSN: 2330-9954
Páginas: 117-120 (4)
Conference
1St Ieee Latin American Symposium on Circuits and Systems (Lascas), Date: FEB 24-26, 2010, Location: BAHAMAS, Patrocinadores: IEEE, IEEE Circuits & Syst Soc, SBC, SBM, UFRGS
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Publication Identifiers
Wos: WOS:000392285500030
Source Identifiers
ISSN: 2330-9954
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