Publicações

Delay Sensing for Parametric Variations and Defects Monitoring in Safety-Critical Applications

AuthID
P-00P-54Q

Author(s)

Vazquez, JC

Champac, V

Ziesemer, AM

Reis, R

Teixeira, IC

Santos, MB

Teixeira, JP

Tipo de Documento

Proceedings Paper

Year published

2010

Publicado

in 2010 FIRST IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS (LASCAS) in IEEE Latin American Symposium on Circuits and Systems, ISSN: 2330-9954

Páginas: 148-151 (4)

Conference

1St Ieee Latin American Symposium on Circuits and Systems (Lascas), Date: FEB 24-26, 2010, Location: BAHAMAS, Patrocinadores: IEEE, IEEE Circuits & Syst Soc, SBC, SBM, UFRGS

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