Dynamics of Charge Carrier Trapping in No2 Sensors Based on Zno Field-Effect Transistors

AuthID
 P-002-75M
8
Author(s)
Andringa, AM
·
Smits, ECP
·
Spijkman, MJ
·
Tipo de Documento
Article
Year published
2012
Publicado
in SENSORS AND ACTUATORS B-CHEMICAL, ISSN: 0925-4005
Volume: 171, Páginas: 1172-1179 (8)
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Publication Identifiers
SCOPUS: 2-s2.0-84864283968
Wos: WOS:000308572700155
Source Identifiers
ISSN: 0925-4005
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