Low-Frequency Noise as a Diagnostic Tool for Oled Reliability

AuthID
 P-00P-8FT
6
Author(s)
Vandamme, LKJ
·
De Leeuw, DM
·
Meskers, SCJ
·
van de Weijer, P
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in 2013 22ND INTERNATIONAL CONFERENCE ON NOISE AND FLUCTUATIONS (ICNF)
Conference
22Nd International Conference on Noise and Fluctuations (Icnf), Date: JUN 24-28, 2013, Location: Montpellier, FRANCE
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Wos®
Publication Identifiers
Wos: WOS:000332005700074
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