Reconfigurations and Diffusion of Trivacancy in Silicon

AuthID
 P-002-7R4
10
Author(s)
Markevich, VP
·
Peaker, AR
·
Lastovskii, SB
·
Murin, LI
·
Markevich, AV
·
Rayson, MJ
·
Svensson, BG
Tipo de Documento
Article
Year published
2012
Publicado
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 407, Número: 15, Páginas: 2974-2977 (4)
Conference
26Th International Conference on Defects in Semiconductors (Icds), Date: JUL 18-22, 2011, Location: Nelson, NEW ZEALAND, Patrocinadores: Univ Canterbury, Ind Res Ltd, MacDiarmid Inst
Indexing
Wos®
Scopus®
Crossref®2
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-84862013445
Wos: WOS:000305790800040
Source Identifiers
ISSN: 0921-4526
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