In Situ Infrared Characterisation of the Interfacial Oxide During the Anodic Dissolution of a Silicon Electrode in Fluoride Electrolytes

AuthID
 P-00P-WGV
3
Author(s)
Ozanam, F
·
Chazalviel, JN
Tipo de Documento
Article
Year published
1996
Publicado
in Surface Science, ISSN: 0039-6028
Volume: 365, Número: 1, Páginas: 1-14
Indexing
Scopus®
Crossref®87
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0030242628
Source Identifiers
ISSN: 0039-6028
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