Publicações

Test Patterns for Iot

AuthID
P-00P-WJQ

Author(s)

Pontes, PM

Lima, B

Faria, JP

Editor(es)

Prasetya, W; Vos, TEJ; Getir, S

Tipo de Documento

Proceedings Paper

Year published

2018

Publicado

in PROCEEDINGS OF THE 9TH ACM SIGSOFT INTERNATIONAL WORKSHOP ON AUTOMATING TEST CASE DESIGN, SELECTION, AND EVALUATION (A-TEST '18) in A-TEST@ESEC/SIGSOFT FSE

Páginas: 63-66 (4)

Conference

9Th Acm Sigsoft International Workshop on Automating Test Case Design, Selection, and Evaluation (A-Test), Date: NOV 05, 2018, Location: Lake Buena Vista, FL, Patrocinadores: Assoc Comp Machinery, ACM SIGSOFT

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